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Image Compression in Real Time Application Using Raspberry Pi -3 Board

Kartik Ingole

Abstract


Whenever we consider any invariant features of the image that can be used for strong organizing between various image of object of sense. The component of the invariant to picture scale and upheaval should be change because of the point of view as the movement of the scale and change in light for the adequately organized with high probability against a colossal informational index of feature from various pictures. This paper depicts the best approach to manage be used for incorporate from various pictures. Today picture getting ready has gotten a point of view while pondering any characteristic of movement in the immense extension picture. This paper presents a steady use of pressing factor of the image getting ready technique which can be capably used for the interfacing with any hardware. This Enhancement estimation are significant for the movement plan which has been describe for picture getting ready computation.

 

Keywords: Image capturing, camera, compression, enhancement algorithm


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References


Goldsmith, C., Ehmke, J., Malczewski, A., Pillans, B., Eshelman, S., Yao, Z., ... & Eberly, M. (2001, May). Lifetime characterization of capacitive RF MEMS switches. In 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No. 01CH37157) (Vol. 1, pp. 227-230). IEEE.

Wibbeler, J., Pfeifer, G., & Hietschold, M. (1998). Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS). Sensors and Actuators A: Physical, 71(1-2), 74-80.

Yao, J. J. (2000). RF MEMS from a device perspective. Journal of micromechanics and microengineering, 10(4), R9.

Rebeiz, G. M. (2004). RF MEMS: theory, design, and technology. John Wiley & Sons.

Rottenberg, X., Nauwelaers, B., De Raedt, W., & Tilmans, H. A. C. (2004, October). Distributed dielectric charging and its impact on RF MEMS devices. In 34th European Microwave Conference, 2004. (Vol. 1, pp. 77-80). IEEE.


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